Elevated temperature is the dominant cause of electronic systems failures, accounting for 55% of them. Thus, there is a need for thermal characterization of electronic circuits. One of main methods of describing their thermal properties is the thermal impedance approach. The mathematical foundations for such measurements were laid down in the JEDEC JESD51 standards series. A system for thermal impedance measurements using a fast, single detector IR sensor was designed and tested, along with dedicated software for thermal characterization of electronic circuits, based on upper surface temperature measurement.
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