We are pleased to announce the granting of patent No. PL 250483 B1, covering an innovative method for non-contact temperature measurement of objects, regardless of their emissivity, reflectivity, and infrared radiation transmittance.
The inventors of the patented solution are:
Dr. Robert Olbrycht, DSc, Eng., from the Institute of Electronics, Lodz University of Technology 👏
Dr. Maciej Jaskulski, DSc, Eng., from the Department of Environmental Engineering, Lodz University of Technology 👏
Dr. Marcin Piątkowski, Eng., from the Department of Environmental Engineering, Lodz University of Technology 👏
💡 The essence of the innovative solution
Traditional temperature measurement methods using thermal imaging cameras and pyrometers require knowledge of the emissivity of the material being examined. An unknown or variable emissivity value can significantly affect measurement accuracy. The developed method eliminates this limitation by using a specially designed measurement chamber with uniformly controlled wall temperature. The chamber temperature is adjusted until the infrared radiation signal from the object being examined becomes identical to the signal originating from the interior of the chamber. At this point, the temperature of the chamber walls corresponds to the temperature of the measured object.
🚀 Key advantages of the developed method:
- No prior knowledge of the object's emissivity is required.
- It eliminates the need to account for the effects of infrared radiation reflectivity and transmittance.
- No reference markers or surface coating are required.
- No spectrometers or modifications to thermal imaging cameras or pyrometers are needed.
🔧 Potential applications of the invention include temperature measurements of liquids, bulk materials, moving objects, electronic components (e.g. transistors), as well as surfaces with non-uniform or variable emissivity.
👏 Congratulations to all the inventors on this achievement! We wish them continued research success and many more innovative developments!